Jeff is the Chief Corporate Metrologist for Fluke. Since joining in 2010, he has driven improvements in measurement quality for engineering, manufacturing and service activities for Fluke and Fortive organizations around the world. He has been a key contributor to development of international standards and practices for calibration laboratories. In 2011 Jeff was recognized by the Measurement Science Conference for outstanding contributions and leadership in metrology, and in 2017 was named a Fluke Fellow, the highest technical award for the company. Prior to joining Fluke, Jeff has co-authored publications with NIST and served as a consultant to NIST and UNIDO. Jeff has a bachelor’s degree from Purdue University in physics.